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Ion beam surface engineering control of thermal energy transport across wide bandgap semiconductor - metal interfaces

Ion beam surface engineering control of thermal energy transport across wide bandgap semiconductor - metal interfaces
Project goal: The goal of this project is to investigate the use of ion-beam induced surface modification to enhance interfacial thermal transport across metal-WBGS interfaces. We will employ a combination of advanced experimental and computational techniques to study the effect of ion-beam surface engineering to aim for enhanced interfacial thermal conductance.

Project description: Power electronics is pivotal for efficient and reliable systems, especially in Kazakhstan's growing energy sector heavily reliant on fossil fuels. Integrating WBGS (SiC, GaN, Ga2O3 and AlN) in power electronics offers higher efficiency, reducing costs and enhancing grid stability. This project explores the potential of ion-beam enabled surface engineering for subsequent enhancement of interfacial thermal transport across WBGS-metal contact interfaces. Utilizing TDTR nanoscale thermal transport measuring technique and NEMD heat transport simulations, we aim to deepen understanding and contribute to the development of more efficient and reliable power electronics

Project facilitators: PI - Kairolla Sekerbayev (Senior Researcher), Abdullayev Azat (Leading Researcher), Rustem Tlegenov (Junior Researcher), Lyazzat Mukhangaliyeva (Junior Researcher)

Realisation period: 2024-2026

Expected results: Two articles and (or) reviews in peer-reviewed scientific publications indexed in the Science Citation Index Expanded and included in the 1st (first) and (or) 2nd (second) quartile by impact factor in the Web of Science database and (or) having a CiteScore percentile in the Scopus database of at least 70 (seventy) will be submitted

Methodology: Wide bandgap semiconductors (β-Ga₂O₃, GaN, SiC, and AlN) will be irradiated with ions at keV energies using a high-energy accelerator. Structural characterization of the treated WBGS surfaces will be performed using grazing incidence X-ray diffraction (GIXRD) and atomic force microscopy (AFM). The structural properties of the metal film deposited on the pre-treated WBGS surfaces will be studied using various advanced techniques: RBS-C, cross-sectional SEM, and FIB-HRTEM. Surface modification, PDOS, and ITC will be simulated using molecular dynamics (MD) to evaluate a wide range of WBGS materials and irradiation parameters

Contacts: Kairolla Sekerbayev, kairolla.sekerbayev@nu.edu.kz, +77773822382